Use of the TTC design to detect epistasis in soybean
Abstract
The study of the nature of the genetic variability present in a population is important, not only for the selection of the type of the cultivar but also for the selection of the more appropriate breeding method. In order to study the epistatic variation for grain yield in soybean, the "Modified Triple Test Cross" (TTC) method for plant self (Jinks et al., 1969) was used. The experimental material used in this work was conformed by 32 lines (Pi ), chosen randomly, which later were crossed with the other 2 lines of the same population, contrasting for grain yield and used as testers (L1and L2 ). During cycle 2006/2007, 100 treatments were evaluated in the design triple lattice tripled (9 replicates) in experimental plots of 2.00 meters length, separated 0.50 meters. Considering the methodology of biometric analysis, the contrast of the means (L 1i + L 2i – Pi ) allowed the detection of significant epistasis through F and t-tests for grain yield in soybean. Therefore it is possible to conclude that, in soybean, the character grain yield is affected by the interaction between loci (epistasis).
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